JB's Circuit

EDA Tool Reduces Chip Test Time With Same Die Size 2-4-16

Cadence combines physically-aware scan logic with elastic decompression in new test solution. What does that really mean? By John Blyler, Editorial Director Cadence recently announced the Modus ...

Gabe's EDA

EDA World Leadership 1-11-16

Gabe Moretti, Senior Editor American companies have been the leaders of the EDA industry since its inception. While in many other industries American companies have lost their advantage over forei...

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