Posts Tagged ‘Synopsys’

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Blog Review: May 2

Wednesday, May 2nd, 2012

By Ed Sperling
Mentor’s Christopher Hallinan digs into Yocto terminology, which includes recipes and unusual terms such as bitbake. This may be further proof that the hardware really can bake the software—or at least someone thought so. No wonder these guys don’t talk. They probably don’t even look at each other.

Synopsys’ Eric Huang raises some interesting questions about literary standards while uncovering the brutal truth about what’s important in the world for today’s youth. Engineering didn’t enter into the discussion.

Cadence’s Qi Wang expounds on digitally assisted analog design, aka DAA, and how it can impact the power-performance-area tradeoffs.

IHS iSuppli sheds some light on the new DoD counterfeit regulations and how they’re going to affect global suppliers and offshore design and manufacturing.

Mentor’s Nazita Saye opens the curtains (and the window) on poor air circulation inside her building in England, why people discuss the weather so often, and a sticky dark substance called Marmite that the locals eat.

Synopsys’ Hezi Saar continues his grilling of University of New Hampshire’s David Woolf about interoperability and conformance of MIPI protocols. It’s a toss up as to who’s in the hot seat.

Cadence’s Richard Goering points the way to a trove of technical papers on subjects ranging from UVM to low power to mixed signal.

Mentor’s Colin Walls takes a crash course in networking and draws some surprising conclusions about Web servers.

Synopsys’ Navraj Nandra looks at the market for Wide I/O and why he believes the market will wait until version 2 before widespread adoption. He attributes it to the lower cost of LPDDR3.

And in case you missed the most recent issue of the System-Level Design newsletter, here are some standout blogs:

—Mentor’s Jon McDonald notes that designing for a worst-case scenario isn’t always the most efficient approach.

—Cadence’s Frank Schirrmeister sheds some light on how EDA choose which processors to back.

—Synopsys’ Nithya Ruff details what it takes to win over the embedded software developer, their customer and their boss.

— Sonics’ Frank Ferro examines the future role of the cloud in all electronics, not to mention SoC designs.

—Arteris’ Kurt Shuler points a spotlight on Intel’s acquisition of Cray and what’s really behind it.

The Week In Review: April 27

Friday, April 27th, 2012

By Ed Sperling
Mentor Graphics rolled out the next generation of its Veloce2 emulation platform, adding virtualization capabilities. The key here is that it allows software engineers to use the platform to verify their software from their PCs, rather than having to go into a lab to work on their code. This is a new wrinkle in emulation, which is now being used as much for software verification as for hardware. Appealing to software engineers is a whole different world.

Cadence roared back to life in Q1, with revenue increasing to $316 million compared to $266 million in Q1 of 2011. Net income was $31 million compared with $6 million in the same period last year. On a non-GAAP basis, net income was $47 million compared with $23 million in 2010. The company expects revenue of between $315 million and $325 million this quarter.

Synopsys extended visibility in HAPS debug FPGA prototypes, adding about 100 times more storage capacity for signal traces while slashing memory utilization for complex designs.

Open-Silicon expanded its solutions portfolio to include architectural analysis and modeling, pre-silicon prototyping, embedded software, co-silicon system design and test and post-silicon validation. It also expanded its ARM Center of Excellence and boosted staffing at its design center in Pune, India.

Tensilica added support for China’s Dynamic Resolution Adaptation standard to its audio encoder/decoder library for its HiFi Audio DSPs. That should open up a huge market.

Soitec said it is ready to provide fully depleted silicon-on-insulator wafers for both 2D and 3D customers. The company claims significant cost savings over bulk CMOS at advanced nodes—a major shift from previous nodes.

Boosting Yield With Layout Awareness

Thursday, April 26th, 2012

By Ann Steffora Mutschler
Yield. Just the word can make many engineers cringe and hide in their cubicles—especially with manufacturing problems and excessive power during test increasing causing failures. But the combination of physical data with diagnostics engines may be the light at the end of the tunnel, allowing for easier pinpointing of defects.

There are many reasons why a chip fails on the tester, and most fall under two areas. One area includes manufacturing problems, explained Bassilios Petrakis, director of product marketing for front-end products at Cadence. “You can think of a case where the wires are not manufactured ideally, so sometimes they might touch because of a short. Or sometimes the wires are thinner than they should be, which causes more resistive type behavior in the wire or they get disconnected. There are tons of defects that are either known, or new ones that come up with new processes.”

Another class of problems is due to excessive power when the chip is tested. “What tends to happen is people design a chip for tolerances when it’s being used in the normal function—in a cell phone or whatever it is—but you also have to consider what happens when you test the chip. We’ve seen failures on the tester. Customers tell us that. And after some work, most people tend to think they are manufacturing defects. A lot of them actually occur because there’s way too much switching activity on the chip that wouldn’t happen in functional mode,” he said, which can cause a chip to fail the test, or even damage the chip itself.

These issues traditionally have been addressed by the diagnostics tools associated with ATPG, but thinking in this area has expanded. Robert Ruiz, senior product line manager for test automation at Synopsys noted that diagnostics has been around for as long as ATPG because they are correlated technologies, but efforts have been underway to improve the accuracy of layout-aware/physical diagnostics tools by pulling in physical information to cut down the search base. “Older diagnostic technology looks at a wire as one node. Everything is connected to it and it can’t pinpoint out. Using physical diagnostics understands that this is not one, single continuous wire but it fans out—there are branches on it. When I think of branches, I think about a defect on that tree. You narrow that tree down among several trees, but if you have more physical information about the tree you know if a defect is along one branch.”

Physical diagnostics use is on the rise due to the accuracy it promises. Connected to this is the need for the infrastructure to support it, which prompted Synopsys to add the ability to read in LEF DEF so it can become layout-aware and run diagnostics, he said.

Alongside traditional diagnosis is volume diagnostics, which brings in another dimension of data into the diagnostic tools. “What’s driving this is the fundamental trend of moving away from individual test engineers diagnosing a fairly small number of failing parts to a much more systematic process,” explained Cy Hay, product marketing manager for ATPG and diagnostics at Synopsys. “It’s not really changing the traditional application. It’s an expansion beyond using diagnostics in an almost offline manner, where there is a test engineer sitting in a lab on a tester with a few failing parts that maybe came back as returned merchandise, to a much more systematic application of diagnostics to improve yield. Especially with the types of yield limiters that customers see today, combined with the pressure to not only bring up a new process node but new designs manufactured in very high volumes, very quickly—there’s clearly a lot of pressure there. The traditional techniques that the fabs have used to improve yield don’t always apply or don’t work as efficiently on some of the more advanced process nodes, especially the aggressive and large designs that are being thrown at a new process node.”

New technology, new challenges
With all of this great new technology, there are challenges too. Geir Eide, DFT product marketing manager at Mentor Graphics, pointed out that part of the challenge now is getting people to talk together. “People who don’t even know the other guys exist—basically connecting product engineers, failure analysis engineers, test engineers, physical design and library designers—you’re basically giving these guys some technical capabilities that allow them to communicate.”

The problem is that they’re not used to talking to each other even though there is much to be gained by opening up this kind of conversation.

“You’re dealing with the fact that something that is beneficial for the product engineers, that will make his job easier, for him to be able to use these capabilities he needs the DFT engineers and the test engineers to enable that,” Eide said. For instance, for diagnosis to work, the data collected on the tester is needed, which means that the test engineer needs to facilitate that. While that doesn’t necessarily makes his job harder, it’s just something that he needs to do to help someone else’s job easier. This means there is a lot more interplay across different organizations and sometimes even across companies where test is outsourced, failure analysis might also be outsourced.

“Part of the beauty of these types of tools is we make it possible for multiple organizations to do the analysis so you don’t need to sit in the fab to do the analysis. You don’t need all the fab data to do this. From that point of view, the challenging piece here is that you have to share data across organizations that normally wasn’t shared, and you have to store the data and make it accessible. On the other hand, you can use software to do a lot of work that previously required you to take a lot of physical devices and slice and dice them and kind of do a lot of expensive, time-consuming analysis,” Eide added.

“The test guys don’t usually give a rip about the physical design—it’s just there. What we are trying to do is being able to make it so that they don’t have to know all the rules and things that they are looking for,” stressed Jeff Wilson, Calibre product marketing manager at Mentor Graphics.

During Mentor’s recent User2User conference, Global Foundries discussed combining diagnosis results that originate from test results and using real silicon data to help validate and identify the yield-limiting design features which ties into DFM tools.

There are a lot of ways things can go wrong. Whether it is a lithography problem, a fill problem, or other issue, being able to determine the root cause of that that problem and being able to fix it is the area that probably is going to bring the biggest benefit to the designers because the test guy shouldn’t have to know all the stuff about the physical design to make things work, he concluded.

From Cryptic Error Messages To Contradictory Commands

Thursday, April 26th, 2012

By Ann Steffora Mutschler
For the past 30 years, semiconductor designers have increasingly relied on automated CAD tools to complete their projects. Over time, these tools have indeed improved from a functionality perspective, but sometimes usability has not kept up with users’ needs.

Depending on which tools and what type of use, some tools are easier to use than others, according to Mike Berry, senior director of engineering at Open-Silicon.

“In general, if you’re talking about the smaller, simpler sorts of designs, it’s fairly easy to go into a tool even if you are reasonably new to it and figure out how to do some of the basic functions. If you’re doing simulation, how do you actually start a simulation running? How do you bring a waveform up in a viewer to look at it? Those sorts of things are easy. If you are doing place and route, you find the button to push to say, ‘Go do a placement,’ or ‘Go insert clocks for me,’ ‘Go do detailed routing.’ It’s when you start getting into the more complex designs where things quickly start to become a lot more challenging because as the tools have evolved over the years, one of the things that we’ve seen happen is that more and more knobs and switches get added to tools, but old ones often aren’t taken away even though they might either be redundant or they might be obsolete or they might not even work anymore or they might contradict some other things that are in the tools. We run into that sort of thing sometimes,” he explained.

What makes a tool easy (or not) to use often comes down to the user interface. “If you’re working with a single tool and using it year after year after year, you get a feel for how it works and how to navigate. But moving between tools is very challenging,” Berry said. As Open-Silicon does a lot of design services, it often is requested or required to use different tools from program to program—a very difficult transition because the user interfaces are so different and in some cases, they’re just not very good.

“One of the things that we’ve talked about here for years is that it seems like in many cases the people developing the tools and developing those user interfaces are software people. This kind of makes sense that that’s who would be writing the underlying code but we can’t help but wonder do those software people ever really talk to the people that use the tools—the hardware designers—and understand, ‘It’s great to have this knob, but I don’t understand what it does or why I care that you did it.’ It’s a really cool programming exercise to figure out how to do that but it’s just not necessarily useful in the real world. That’s been a complaint of ours for years and years. The tools are not geared toward the users’ needs for the tools, even some of the functionality they provide,” he said.

Another issue that complicates EDA tool usage is error messages that come out of the tools. “In many cases the word I think you’ll hear from most people is ‘cryptic.’ You get this error message: ‘Stack trace fault at hex 3279,’ and then the tool sits there with a blinking cursor waiting for you to do the next thing, and it’s like, ‘What do I do with that?’” Berry pointed out. “That one may be an extreme but something about ‘couldn’t find net to query’ or something really, really cryptic. You have no idea what line number in the script it was at, or anything about it, and you just stare at it and think, ‘I don’t know what to do.’ We start doing binary searches through the code. Let’s delete the bottom half of the code, and run the top half and see if we still get that message. We start trying to start zero in on where the problem is and eventually usually you can find out what’s going on but the amount of debug time is really painful sometimes.”

One particular set of tools that Open-Silicon is using now is just terrible in terms of some basic features that should exist but don’t, Berry said. As a result, his team has resorted to writing their own TCL algorithms to access very low-level database functions to do some things that just should be there. “The database obviously has all of the information you need and you can in fact query it, but instead of right clicking on a net and asking for some information about it, you have to write 20 lines of code that essentially uses the API that exists to get into the database.”

Tool providers chime in
Jeff Wilson, Calibre product marketing manager at Mentor Graphics, noted that users always want the tools to be easier to use. “We have is a spectrum. For example, in a fab there are people who really understand Calibre so other people have someone they go to and ask about. In fabless companies we probably need something that’s a little more turnkey. They do have expertise they can go to ask questions. But fabless guys are all over the spectrum as well. They are leading-edge guys who basically take the deck and run stuff. If it’s a test engineer we’re learning what particular applications we want to lead with and which ones we would probably not lead with just because of the learning curve involved. We’ve had very good success being able to work with customers to be able to prove out the data points, but now we’re in this space of fine tuning that to be able to say for this particular customer, this is the message and the packaging that we’d need to go with.”

Connected to this is the work EDA vendors do on an ongoing basis to broaden the reach of the tools.

Robert Ruiz, senior product line manager for test automation at Synopsys, noted that last year the company started addressing the ability for a broader set of users to easily set up the tools rather than just the traditional person using volume diagnostic tools. Additionally, Synopsys test tools now support the LEF DEF standard as well as a SEMI standard that describes tester output in order to allow users to gather data from many different types of testers.

Similarly, Geir Eide, DFT product marketing manager at Mentor Graphics, said usability is becoming extremely important as lines blur between domains. “We have tools that are made for yield or product engineers that are based on test technology. We have to make sure it doesn’t look like another test tool because it’s not really for test people. This is something we have tried to take into account and it’s going to continue to be important as we see technology versus domain crossover-type things. People always want easier to use tools but the meaning of ‘easy to use’ is changing a little. A lot of the tools we have are built on DFT technology but the users are either product engineers or failure analysis engineers that know absolutely nothing about DFT or the underlying technology so we have to try to make that part of it invisible. You don’t have to force everybody to take courses in DFT just to utilize some of the data that that provides.”

At the end of the day, Open-Silicon’s Berry gave credit to the EDA tool companies for the advances in the algorithms tools are using, and the way they approach doing certain functions. “There’s been a lot of algorithmic development and lots of optimizations within the tools to help with runtimes and help with making it possible to manage huge sets of data in ways that were just not possible not very many years ago. Certainly there’s a lot of development work going on there. The advent of some of the new design verification methodologies starting back with Specman, Vera, VMM, OVM and now UVM—that’s been a huge improvement in verification productivity and thoroughness. That’s a very, very powerful recent addition to the tool flows.”

Gap Vs. Gap

Thursday, April 26th, 2012

By Ed Sperling
Among tools vendors it’s been standard practice to listen closely to customers but not deliver everything they ask for—or at least not always on the customers’ timetable.

This strategy has worked well enough for both sides in the past, but at 20nm and in stacked die configurations, the level of tension between these two worlds is increasing, and the gaps in the tool chain are becoming more noticeable. Part of the problem is that skyrocketing complexity is forcing more automation, but integration issues, physical effects, process variation and the realities of physics make it more difficult and time-consuming to develop tools to make that complexity more manageable. R&D budgets for EDA companies already are hovering around 30% or more, compared with average R&D investments of about 10% to 20% in other areas of chip development and manufacturing, and betting on the wrong area can have a significant impact on EDA company’s earnings.

The other part of the problem is that chipmakers’ own internal tools are running out of steam at advanced nodes because of the need to bridge both hardware and software design environments and because old methods of doing things are way too slow and very often ineffective. This is clearly reflected in the fortunes of EDA tools vendors, which have been rising steadily for the past couple of years, with the strongest growth in areas such as ESL, including hardware-software co-design and software prototyping, and emulation.

Add in stacking of die, in both 2.5D and 3D configurations, and the number of issues that have to be dealt with by both chipmakers and tools vendors increases by orders of magnitude. On top of that there are double patterning issues at 20nm, finFETs at 14, and potentially 450mm wafers that will require significantly higher yields to be cost-effective, but which may be harder to test in wafer-on-wafer or die-on-wafer configurations.

Where chipmakers see challenges
Riko Radocjic, director of design for silicon initiatives at Qualcomm, breaks the design process down into three areas—design authoring, which is the actual chip design; pathfinding, which includes exploration for how to best build a chip; and tech tuning, which is physical space exploration. Most of the EDA tools have been effective in the design-authoring phase, with some point tools now finding their way into the pathfinding area. But the real challenges are in the tech-tuning area.

Mechanical stress becomes a serious issue in 3D stacks, ranging from the effects of TSVs to die alignment. “You cannot solve the problems with a tool. They have to be solved in a flow,” he said. “It’s a debug nightmare. You need a separate domain that takes external stresses and produces a set of rules. You also need hotspot checking to make sure you have caught all of the interactions.”

Also missing, he said, are EDA tools that understand the materials inside a stacked die, and a standard PDK for all mechanical and thermal properties.

“Thermal is the next frontier,” he said during a presentation at the Electronic Design Process Symposium this month. “You need to manage for hotspots and overall system power. On a global level you have skin temperature and overall system power. On a local level you have to manage hot spots, junction temperatures and power density. And there is also the compounding factor that all advanced systems use some form of thermal management. We need a system-chip co-design methodology and tools to deal with this. We cannot solve thermal issues only at the component level. It must be system and component, and we will need tools for pathfinding thermal issues. We don’t even know where to put our thermal sensors. We need thermally aware floor planning.”

Summing it up, he said it amounts to 3D-aware co-design tools for package, system and thermal, and a flow to integrate everything.

A stacked die of the future; memory on top left, with logic/memory in middle on top and I/O and analog RF blocks on top right. All feed into interposer stack in the middle. Source: Qualcomm.

Altera, which has just developed its first 2.5D stacked FPGA prototype, is encountering similar thermal and mechanical issues. While the company continues to offer scaled down tools for FPGA development, it needs the most advanced tooling for creating those FPGAs in the first place. Topping his list are robust standards for cells, IP and stacked ICs, as well as tools to help quickly identify some of the problems that Altera encountered while developing its prototype stacked die.

Signal integrity issues encountered and addressed by Altera in stacked die using interposers.

“We’re looking for more of a divide and conquer strategy,” said Arif Rahman, product architect at Altera. “Die stacking will be an enabler for a complete solution in the future, but it will not just be an FPGA. It will be an FPGA plus other accompanying functions.”

Where EDA tools vendors see challenges
For the tools vendors, the list of problems that need to be solved is exploding. So many things need to be fixed and solved that it’s imperative just to focus on both what will have the most impact and what will provide the greatest long-term returns.

At least part of that effort involves existing tools, which have to be run faster and do more things than in the past. This is particularly true in areas such as emulation, which in the past were used almost exclusively for hardware. They are now becoming the tool of choice for software verification because the complexity of the software makes it far too slow to run using simulation. What takes hours or days in simulation can be measured in seconds in emulation. And given the fact that verification is still the lion’s share of the NRE, anything that can be done to solve this problem is considered a big win.

Mentor Graphics’ announcement this week of enhancements to its emulation tools is a case in point. Recognizing that software engineers are using the emulation tools as much as the hardware engineers, the company has added a virtualization layer that allows a workstation to be a front end—matching the way software engineers work—rather than doing work in a lab the way hardware engineers typically work.

“This allows one workstation per user,” said Jim Kenney, director of marketing for Mentor’s Emulation Division. “We’ve also been working to improve performance and capacity so you have more robust software execution and debug.”

Mentor isn’t alone in this quest. Cadence has been updating its own emulation, and all the EDA vendors have been racing to improve the reach and integration of their tools. Bassilios Petrakis, product marketing director at Cadence, noted that building smaller die that yield better is still a challenge that needs to be solved—particularly before stacking becomes mainstream.

“When you look at multiple die with TSVs, the cons are that the ecosystem is still emerging, there is no volume production yet and there are thermal issues,” Petrakis said.

Samta Bansal, senior product marketing for SoC Realization at Cadence, predicts that stacking memory on logic using an interposer will become mainstream beginning in 2013 to 2014, with TSVs becoming mainstream by 2015. She said work in EDA typically needs to begin three to four years before these efforts, noting that it began in earnest at Cadence in 2009. Synopsys rolled out its 2.5D tool flow last month and is working on a full 3D flow, and Mentor has been working on a variety of areas ranging from test to modeling of stacked die over the past several years.

But EDA vendors also need to pick new areas for the future, and this is where even the best educated guesses become difficult.

“EDA traditionally has been an industry where big companies acquire small companies doing interesting things,” said Wally Rhines, chairman and CEO of Mentor, noting that markets that have shown strong growth include DFM, formal verification, ESL and power analysis. He said the next wave of electrical design challenges include low-power design at higher levels of abstraction, optimizing embedded software for power, in-circuit emulation, design for test, physical verification, stacked die verification, and system design that extends beyond the PCB.

That concern is echoed by Drew Wingard, chief technology officer at Sonics: “From an EDA perspective, the next layer up in the power hierarchy is how we convince ourselves that the hardware and software are working together correctly. This is a different protocol check than we normally do. You have dependencies, because you can’t turn off one until another turns off. The mix of hardware and software makes it difficult to prove what’s correct. Right now there is not even enough time to test the power management until the second spin.”

He noted that just trying to get software to turn on the power management features in a chip is a challenge. “The thermal/power reduction to be gained by turning on features already in a chip can be significant.”

One issue that almost certainly needs attention is derivative designs. Getting them out the door is painful, expensive, and time-consuming.

“A lot of engineering that’s being done is derivative engineering,” said Naveed Sherwani, president and CEO of Open-Silicon. “This is not something that EDA vendors focus on, but it’s something that’s definitely needed. What’s out there is a kluge of methodologies and flows. EDA so far has not woken up to this opportunity. They certainly listen to their customers, but they’re still not close enough. You have to do the work to understand it, and the revisions and changes that are needed are painful. A derivative is almost like a new project. There can be 1 million degrees of improvement here.”

Conclusions
All of this requires tools—notably more and new capabilities built into existing tools—as well as new tools that can integrate all of these pieces. But what gets addressed first is a difficult balance.

While chipmakers at the leading edge are used to developing some of their own tools, methodologies and dealing with poor yields, their existing development is running out of steam. That means moving forward at advanced nodes and in stacked configurations will require developing entirely new versions of tools, methodologies—an enormous expense by anyone’s calculations.

Qualcomm's proposed tech-tuning flow.

EDA vendors, meanwhile, have their work cut out for them just updating their existing tools, and they are cautious about massive investments in new areas that may not return dividends within an appropriate time frame—or within an immature supply chain when it comes to stacking of die.

“To get ROI back on tools of this complexity you need more than 20 customers,” said Mike Gianfagna, vice president of marketing at Atrenta. “That means you’re going to be negative on that investment for three or four years. So you really have to pick your battles, and small companies probably can’t do this at all.”

Gianfagna noted that for chipmakers the challenge is too many options. “You need a way to prune the solutions space fast. You have to figure out which architectures to choose quickly and which roads to pursue further. The real gap is not in the tech tuning. It’s coming up with the right architecture that supports meaningful decision-making.”

The question now is when the gaps that each side sees will merge, and when it will become profitable enough to take an investment risk.

High-End Audio Made Easy: The Software Story

Wednesday, April 25th, 2012

Audio requirements are soaring. Whereas audio used to be done in a few spare cycles of the main CPU, decoding today’s Blu-ray Disc 24-bit, 192 kHz high-definition audio streams, or post-processing 9.1 channel Pro Logic IIz streams, requires significant performance. An obvious solution is to offload the processing to one or more dedicated audio digital signal processors (DSPs) such as the DesignWare ARC AS211SFX/AS221BD Audio Processors, but this complicates system design and introduces a number of hardware and software challenges. This white paper elaborates on these challenges and presents a number of architectural solutions. In addition to the offloading complexities, this paper covers the integration of audio processing software in larger multimedia and product software stacks, by describing how to integrate audio software into popular Linux- and Android-based systems.

To download this white paper, click here.

Blog Review: April 25

Wednesday, April 25th, 2012

By Ed Sperling
Mentor’s Colin Walls shows off his robot demo in a video from Design West, aka ESC, and wonders why the video isn’t going viral. Maybe a different outfit would help—for the robot, that is.

Synopsys’ Karen Bartleson and Yvette Huygen interview Peter Ateshian of the Naval Postgraduate School about technology being developed below 22nm. If you want a fascinating glimpse into the future, here it is, but the audio segment runs 30 minutes so plan ahead.

Cadence’s Richard Goering takes a look at how Specman and e changed IC verification in an interview of Andy Eliopoulos. Just to put it in perspective, it’s been seven years since Cadence acquired Verisity.

But why all the noise about e these days? DeepChip’s John Cooley reports on the language wars simmering between e and System Verilog. Apparently the fire is still going on this one.

IHS iSuppli’s Hailin Zhao predicts China’s wireless infrastructure investment, particularly for LTE, will peak in two years and begin declining slowly after that. But that also means LTE-enabled devices should really pick up after that.

Synopsys’ Eric Huang looks at what makes Intel’s new processor so fast. Hint: It has something to do with integration of USB 3.0.

Cadence’s Reuven Naveh digs into why constraints are ignored in the e language and whether it’s a tool bug.

Mentor’s Bernard Sutton examines what he calls the black art of PCBA test and quality. The key is a mix of process and test skills, which don’t ordinarily go together. But we’re much more forgiving these days about heresy and black arts.

Verification engineers should check out the blog posted on the Synopsys Verification Martial Arts site by Cavium’s’ Brian Hunter about customizing UVM messages without getting a sunburn. If you’re working on verification, you probably don’t see the sun very often. That explains why UVM is endorsed by the American Dermatology Association.

The Week In Review: April 20

Friday, April 20th, 2012

By Ed Sperling
Mentor Graphics rolled out the next release of its Questa verification platform, bolstering its UVM support, accelerating coverage closure and adding low-power verification based upon UPF.  It also added MIPI protocol verification IP to the Questa IP library. On the software front, Mentor moved its BridgePoint UML editor into the open source domain, and it teamed up with Stonestreet One to unveil an integrated low-power Bluetooth software stack for Mentor’s Nucleus embedded RTOS.

Synopsys won a deal with Renesas, which has adopted its Proteus LRC for lithography verification.

Atrenta took a different tack in the IP utilities business. It’s allowing companies to use its IP cleaning kit on their IP blocks for two weeks at no cost, testing design completeness, power consumption and integration risks, among other things.

Arteris won a deal with Core Logic, which has licensed its FlexNoC interconnect IP for its next-gen mobile and multimedia processors.

Tensilica won a deal with Renesas for its digital baseband signal processing IP core, which will use those cores in its upcoming products for digital broadcasting receivers.

Blog Review: April 18

Wednesday, April 18th, 2012

By Ed Sperling
Mentor’s Colin Walls has hit upon one of the most important points in embedded software—the value in open source is in the ability to integrate it. And therein lies a potential hidden cost—not to mention all the Mountain Dew needed to pump up software programmers. Just try submitting that expense report to a hardware company, though.

Speaking of software, Cadence’s Jason Andrews looks at modeling large memories in SystemC. This language is finally catching on, but the uptake is still painfully slow.

Synopsys’ Helene Thibieroz talks with AMD engineers about using Verilog-AMS with UVM. This stuff is getting very complicated.

Semico’s Joanne Itow charts wafer demand over the past quarter century. If you thought the semiconductor business was cyclical, check out the jagged red line in the middle chart. Yikes!

IHS iSuppli’s Henning Wicht looks at another side of this market—polysilicon pricing. Apparently there is a glut of this stuff at the moment, which should make for lower prices over the next year.

What do Yocto, Poky and Angstrom have in common—aside from the fact that they sound like reindeer commands? Mentor’s Christopher Hallinan sheds some light on an alternative universe. And yes, it’s true. Software engineers really do speak a different language.

Cadence’s Richard Goering questions whether system modeling is the next abstraction layer for EDA. This one is probably best answered in a rear-view mirror, but it’s an interesting question.

Synopsys’ Eric Huang is rounding up viewers for his USB video. He claims it’s the best seven minutes you can spend. You can have it out with him if you don’t agree.

Mentor’s Nazita Saye does what all good engineers do when they go car shopping. They read all the reports about what can go wrong, figure out what causes the problem—in this case it’s electromigration on a PCB for the water pump—and then proceed to make an educated decision about what warnings to ignore.

Blog Review: April 11

Wednesday, April 11th, 2012

By Ed Sperling
Synopsys’ Karen Bartleson looks at the effect of global markets on standards. This is particularly important because standards tend to stick around for a very long time—sometimes decades.

Mentor’s Colin Walls compares embedded and desktop processors with an old Cray supercomputer, which consumed 60 Kw/hr. We’ve come a long way. Check out the picture.

Cadence’s Richard Goering plucks the highlights from complex stacked die presentations at last week’s Electronic Design Processes Symposium. Stacking issues are coming to a design near you—and much more quickly than you might imagine.

John Cooley’s DeepChip taks a look at the formal and CDC tools available and what exactly they do. This should help take some of the mystery out of this market.

IHS iSuppli reports on the five most counterfeited semiconductor categories in 2011. Analog wins by a hefty margin, which says something about profit margins in the analog sector.

Synopsys’ Eric Huang has constructed a demo of the new SuperSpeed Interchip spec, which isn’t even quite at the beta stage. He rates it release 0.9. There’s a video to go along with it.

How much is experience worth? Mentor’s Robin Bornoff gave thermal modeling software to his 15-year-old son to find out.

Synopsys’ Helene Thibieroz picks out some of the highlights of the recent Synopsys User Group, including AMS verification using UVM and FinFETs to extend the life of transistors.

Cadence’s Ahmed Elzeftawi looks at real-number model development and its application in AMS verification. This is a great overview of some of the most common causes of re-spins.

And in case you missed the most recent Low-Power Engineering newsletter, here are some standout blogs:

–Synopsys’ Cary Chin solves the mystery of why the new iPad takes so long to charge and why it consumes more power.

–Mentor’s Barry Pangrle digs into the differences between FinFETs and TriGate transistors, and why not all FETs are created equal.

–Tensilica’s Chris Rowen expounds on what really makes the design process work—people.

–Docea Power’s Ghislain Kaiser details the reasons why general models don’t work—and the best approaches to reducing design time and problems.

–And along the same lines, Apache Design’s Arvind Shanmugavel looks at the need for accurately modeling thermal, mechanical and electrical behavior.

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